Laboratory of  X-ray and Electron Microscopy Research

Main subject of research:

• X-ray absorption and photoelectron studies of the electronic structure of materials.
• XANES and EXAFS investigation of local structure in solids.
• Determination of crystal-structure parameters of bulk materials and nanostructures by X-ray and electron diffraction methods.
• Investigation of crystal defects by X-ray high resolution diffractometry and electron microscopy.
• Investigation of structural properties of crystals as a function of composition, temperature and pressure.
• Studies of strain and elastic properties of bulk materials and multilayers using X-ray diffraction methods.
• SIMS investigation of content and distribution of trace elements and kinetics of dopants.
• New methods for atomic and electronic structure studies low dimensional materials used in technology of electronic devices.
• Rutherford backscattering spectrometry (analysis of sample composition) and ion channeling (measure of crystal structure).
• Ion implantation, energy 250keV - 3 MeV.

Materials studied:

• A^IIIB^V compounds bulk and nanostructures (pure and doped).
• Nanostructures of A^IIB^VI compounds (including semimagnetic semiconductors, pure and doped).
• High temperature superconductors - thin films and bulk crystals.
• Composites.
• Ceramics.
• Transition metal complexes with coumarin and thiourea derivatives.
• Materials for biomedical applications.
• Bulk and low-dimensional semiconductor materials and systems, superconductors, magnetic compounds.
• Bulk oxide materials, mostly those potentially applicable in optoelectronics.
• And others.

Major facilities:

• X-ray/UV photoelectron spectroscopy (XPS/UPS)
• FEG monochromated Cs image corrected Transmission Electron Microscope Titan CUBED 80-300.
• High resolution transmission electron microscope JEM 2000 EX (JEOL).
• High-resolution X'Pert MRD (Materials Research Diffractometer) diffractometer (supplied by Philips, now Panalytical) equipped with Cu X-ray tube, parabolic X-ray mirror, germanium (220) asymmetrical Bartels monochromator giving monochromatic beam with divergence 20", germanium (220) analyzer; high-temperature chamber.
• X'Pert MPD (Multi-Purpose Diffractometer) diffractometer/reflectometer (supplied by Philips, now Panalytical) equipped with Cu X-ray tube, germanium (111) Johansson monochromator, semiconductor linear position-sensitive detector
• Secondary ion mass spektrometer Cameca IMS 6f.
• Accelerator 3SDH-2 Pelletron.
• Infrared spectroscopy (FTIR).
• UV-Vis Spectrophotometer.